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nSpec™ LS

nSpec™ LS is the flexible benchtop system for labs and low-volume production environments.

Information

The World's Most Advanced Automated Optical Inspection System with nTelligence™

The nSpec™ LS includes Nanotronics’ proprietary Artificial Intelligence Software, nTelligence™. The platform is highly flexible in its ability to detect defects on a variety of wafers, substrates, and materials. Any defects observed using the system’s various imaging modalities can be labeled and used to train customer-specific automatic classification models.

The nSpec™ LS platform is designed to streamline R&D efforts and optimize process improvement for customers working across any precision manufacturing industry. nSpec™ LS is equipped with user-friendly software that makes it easy to configure recipes and allows for effortless modification and saving of recipes as needed.

nSpec LS

Advanced AI Inspection

Nanotronics’ sophisticated AI adds the ability to not only detect defects but also classify them, helping to assign causality and provide fast feedback to correct the manufacturing process. Tuned for speed and high-quality inference from limited data, the software utilizes customized enhancements for deep learning and convolutional networks. In addition to nTelligence™, the nSpec™ LS also includes a suite of computer vision analyzers.

Semi Automated Inspection for

Substrate, epi, and patterned wafers

Transparent and opaque materials

Si, SiC, GaN, InP, Glass, Graphene, and more

Die on film tape, trays, gel-pak or waffle packs

Photomasks

Sample fragments

Features

nSpec™ LS Features

  • Consistent resolution settings, ranging from 0.3 µm and greater
  • Rapid scanning
  • Computer vision analyzers
  • nTelligence™ defect classification
  • Customizable defect reports
  • Customizable export formats
  • Variety of sample chucks to meet specific needs
  • Robust analysis for defect or feature of interest detection and classification
  • Inspection and review procedures
  • Small footprint and minimal facilities requirements
  • Rack mount controls
  • Field upgradeable to nSpec™ PS system
nSpec LS system

Specs

nSpec™ LS Specs

Download Spec Sheet

System

Weight
240 kg
Dimensions (W x D x H)
165 cm x 157 cm x 194 cm
Min. Vacuum Requirement
-21 in. Hg (-70 kPa)
Power Supply
208—240 VAC, 15A, 50—60 Hz

Optics

Illumination Modes
Brightfield, Darkfield, Automated DIC (Nomarski)
Light Source
White light LED (other options available)
Objectives
5x (included), 1.25x, 2x, 2.5x, 10x, 20x, 50x
Objective Turret
5-position, User-selectable

Stage

Travel, typical
200 mm X and Y directions
Positioning
Linear servo motors with closed-loop encoders (50 nm resolution)
Repeatability
+/- 2 µm
Travel Flatness
30 µm
Centered Load Capacity
2.27 kg

Options

Supported Protocols
SECS/GEM
Illumination
Transmitted light with automated polarizer
Filters
12-position filter wheel
More
CleanCube (Modular Clean Environment)
Offline Workstations

Fewer Defects - Higher Yield

See it for Yourself

Nanotronics Inspection Systems delivers the resolution, intelligence, and automation precision that modern manufacturing demands. The difference is visible from the very first scan. Get in touch and see the results for yourself.

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Automated inspection in progress