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nSpec™ CPS

The nSpec CPS is the ideal system for high-volume manufacturing environments.

Information

The World's Most Advanced 300mm Fully Automated Optical Inspection System with nTelligence™

The nSpec™ CPS includes Nanotronics’ proprietary Artificial Intelligence Software, nTelligence™. The platform is highly flexible in its ability to detect defects on a variety of wafers, substrates, and materials. Any defects observed using the system’s various imaging modalities can be labeled and used to train customer-specific automatic classification models.

nSpec™ CPS is the ideal system for fully automated high-volume manufacturing environments. User-friendly software makes configuring recipes next to effortless and as needs evolve, recipes are easy to save and modify.

nSpec CPS

Advanced AI Inspection

Nanotronics’ sophisticated AI adds the ability to not only detect defects but also classify them, helping to assign causality and provide fast feedback to correct the manufacturing process. Tuned for speed and high-quality inference from limited data, the software utilizes customized enhancements for deep learning and convolutional networks. In addition to nTelligence™, the nSpec™ CPS also includes a suite of computer vision analyzers.

This 300 mm design supports

HEPA air filtration

Air ionizers

Single or Multiple load ports: 200mm and/or 300mm

Features

nSpec™ CPS Features

  • Automatic wafer handling
  • Multiple resolution settings, ranging from 0.3 µm and greater
  • Rapid scanning
  • Computer vision analyzers
  • nTelligence™ defect classification
  • Customizable defect reports
  • Customizable export formats
  • Flexible settings for single image capture and scans
  • Variety of sample chucks to meet specific needs and manual loading applications
  • Robust analysis for defect or feature of interest detection and classification
  • Inspection and review procedures
  • Small footprint and minimal facilities requirements
  • Rack mount controls
  • Door interlocks
  • Automatic prealignment by notch or flat
  • Mapping for wafer presence, cross slot detection, and double stacked wafers
nSpec CPS system

Specs

nSpec™ CPS Specs

Download Spec Sheet

System

Weight
1180 kg
Dimensions (W x D x H)
240 cm x 194 cm x 262 cm
Min. Vacuum Requirement
-21 in. Hg (-70 kPa)
Power Supply
208—240 VAC, 15A, 50—60 Hz
Min. Clean Dry Air
60PSI (415 kPa)

Optics

Illumination Modes
Brightfield, Darkfield, Automated DIC (Nomarski)
Light Source
Green LED (other options available)
Objectives
5x (included), 1.25x, 2x, 2.5x, 10x, 20x, 50x
Objective Turret
5-position, User-selectable

Stage

Travel, typical
350 mm X and Y directions
Positioning
Linear servo motors with closed-loop encoders (50 nm resolution)
Repeatability
+/- 2 µm
Travel Flatness
20 µm
Centered Load Capacity
5 kg

Options

Supported Protocols
SECS/GEM
Filters
12-position filter wheel
More
OCR (Frontside and/or Backside)
Air Ionizers
200mm cassette adapter for Load Port
Sample Specific Fixtures
Offline Workstations

Fewer Defects - Higher Yield

See it for Yourself

Nanotronics Inspection Systems delivers the resolution, intelligence, and automation precision that modern manufacturing demands. The difference is visible from the very first scan. Get in touch and see the results for yourself.

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Automated inspection in progress